A. G. Aberle, Progress in Photovoltaics: Research and Applications, vol.8, 2000.

J. L. Regolini, D. Benoit, and P. Morin, Microelectronics Reliability, vol.47, 2007.

D. K. Schroder, Semiconductor Material and Device Chracterization, 2006.

M. Wilson, J. Lagowski, L. Jastrzebski, A. Savtchouk, and V. Faifer, AIP Conference Proceedings, vol.550, issue.1, 2001.

D. K. Schroder, Electron Devices, IEEE Transactions on, vol.44, issue.1, 1997.

G. Lupke, Surface Science Reports, vol.35, issue.35, 1999.

P. N. Butcher and D. Cotter, The Elements of Nonlinear Optics, 1991.

J. E. Sipe, D. J. Moss, and H. M. Van-driel, Physical Review B, vol.35, issue.3, 1987.

G. Hamaide, F. Allibert, F. Andrieu, K. Romanjek, and S. Cristoloveanu, Solid-State Electronics, vol.57, issue.1, 2011.

W. Daum, Applied Physics A, vol.87, issue.3, 2007.

K. Kotaro, T. Hideo, and F. Atsuo, Japanese Journal of Applied Physics, vol.30, issue.5R, 1991.

X. Li, J. Willits, S. T. Cundiff, I. M. Aarts, A. A. Stevens et al., App Phys Lett, vol.89, issue.2, 2006.

J. Sipe, D. Moss, and H. Van-driel, Physical Review B, vol.35, issue.3, 1987.

H. W. Tom, T. F. Heinz, and Y. R. Shen, Phys Rev Lett, vol.51, issue.21, 1983.

J. I. Dadap, B. Doris, Q. Deng, M. C. Downer, J. K. Lowell et al., App Phys Lett, vol.64, issue.16, 1994.

H. Park, J. Qi, Y. Xu, K. Varga, S. M. Weiss et al., phys. stat. sol. (b), issue.8, p.247, 2010.

B. Jun, Y. V. White, R. D. Schrimpf, D. M. Fleetwood, F. Brunier et al., App Phys Lett, vol.85, issue.15, 2004.

J. J. Gielis, B. Hoex, M. C. Van-de-sanden, and W. M. Kessels, J App Phys, vol.104, issue.7, 2008.

N. M. Terlinden, G. Dingemans, V. Vandalon, R. H. Bosch, and W. M. Kessels, J App Phys, vol.115, issue.3, 2014.

D. Damianos, G. Vitrant, A. Kaminski-cachopo, D. Blanc-pelissier, G. Ghibaudo et al., J App Phys, vol.124, issue.12, 2018.

S. W. Glunz, J. Benick, D. Biro, M. Bivour, M. Hermle et al., 35th IEEE Photovoltaic Specialists Conference, 2010.

J. P. Carrère, S. Place, J. P. Oddou, D. Benoit, and F. Roy, IEEE International Reliability Physics Symposium, 2014.

G. Dingemans and W. M. Kessels, Journal of Vacuum Science & Technology A, vol.30, issue.4, 2012.

I. Ionica, D. Damianos, A. Kaminski, G. Vitrant, D. Blanc-pélissier et al., ECS Transactions, vol.72, issue.2, 2016.

S. Cristoloveanu, M. Bawedin, and I. Ionica, Solid-State Electronics, vol.117, 2016.

B. Jun, R. D. Schrimpf, D. M. Fleetwood, Y. V. White, R. Pasternak et al., IEEE Transactions on Nuclear Science, vol.51, issue.6, 2004.

M. L. Alles, R. Pasternak, X. Lu, N. H. Tolk, R. D. Schrimpf et al., Semiconductor Manufacturing, vol.20, 2007.

D. Damianos, G. Vitrant, M. Lei, J. Changala, A. Kaminski-cachopo et al., Solid-State Electronics, vol.143, 2018.

, ECS Transactions, vol.97, issue.1, pp.119-130, 2020.