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Article Dans Une Revue Thin Solid Films Année : 1997

Combined characterization of group IV heterostructures and materials by spectroscopic ellipsometry and grazing X-ray reflectance

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hal-02540738 , version 1 (11-04-2020)

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P. Boher, J.L. Stehle, L. Hennet. Combined characterization of group IV heterostructures and materials by spectroscopic ellipsometry and grazing X-ray reflectance. Thin Solid Films, 1997, 294 (1-2), pp.37-42. ⟨10.1016/s0040-6090(96)09229-2⟩. ⟨hal-02540738⟩
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