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Optical sectioning with Structured Illumination Microscopy for retinal imaging: inverse problem approach

Abstract : Structured Illumination Microscopy (SIM) is an imaging technique for obtaining super-resolution and optical sectioning (OS) in wide-field fluorescence microscopy. The object sample is illuminated by sinusoidal fringe patterns at different orientations and phase shifts. This has the effect of introducing high frequency information of the object into the support of the transfer function by aliasing. The resulting image is processed with dedicated reconstruction softwares which allow recovering high frequencies beyond the instrument cut-off and, simultaneously, removing the light coming from the out-of-focus slices of a 3D volume (which is called optical sectioning). Unfortunately, whereas for static samples the phase shifts of the sinusoids can be set by the user thus providing analytical solutions, this is not possible for \textit{in-vivo} samples, and in particular for retinal images, due to the uncontrolled eye movements. The aim of this communication is to demonstrate that SIM can be applied to \textit{in-vivo} retinal imaging in order to obtain both OS and super-resolution from flood-illuminated and adaptive-optics corrected observations. We introduce a new approach, within the Bayesian framework, which allows in a simple way to achieve maximal OS. For that purpose, a conventional wide-field image is registered and subtracted with respect to each one of the low resolution SIM observations, hence, the resulting differential data only contains information on the in-focus slice of the object. Because our method does not model explicitly a 3D observation but keeps the simplicity of a 2D model, it is fast and easy to implement in practice. We show results from simulations that prove the validity of our approach.
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Contributor : François Orieux <>
Submitted on : Friday, March 6, 2020 - 2:01:53 PM
Last modification on : Tuesday, March 16, 2021 - 3:42:15 PM
Long-term archiving on: : Sunday, June 7, 2020 - 2:13:07 PM

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Roberto Baena-Gallé, Laurent Mugnier, François Orieux. Optical sectioning with Structured Illumination Microscopy for retinal imaging: inverse problem approach. 26eme Colloque GRETSI Traitement du Signal & des Images, Sep 2017, Juan-les-pins, France. ⟨hal-02500903⟩

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