Improved physics-based analysis to discriminate the flicker noise origin at very low temperature and drain voltage polarization

B Cretu (1) , D. Boudier (1) , E. Simoen (2) , A. Veloso (2) , N. Collaert (2) , C. Claeys (3)

1 Equipe Electronique - Laboratoire GREYC - UMR6072
2 IMEC - IMEC
3 KU Leuven - Catholic University of Leuven = Katholieke Universiteit Leuven

Domaines: Micro et nanotechnologies/Microélectronique

B Cretu, D. Boudier, E. Simoen, A. Veloso, N. Collaert, et al.. Improved physics-based analysis to discriminate the flicker noise origin at very low temperature and drain voltage polarization. Solid-State Electronics, 2020, pp.107771. ⟨10.1016/j.sse.2020.107771⟩. ⟨hal-02475438⟩