R. Bayerer, T. Herrmann, T. Licht, J. Lutz, and M. Feller, Model for power cycling lifetime of IGBT modules -various factors influencing lifetime, Proc. 2008, 5th International Conference on Integrated Power Systems (CIPS), pp.1-6

M. Ecker, J. B. Gerschler, J. Vogel, S. Käbitz, F. Hust et al., Development of a lifetime prediction model for lithium-ion batteries based on extended accelerated aging test data, Journal of Power Sources, vol.215, pp.248-257, 2012.

H. Huang and .. A. Mawby, A lifetime estimation technique for voltage source inverters, IEEE Transactions on Power Electronics, vol.28, pp.4113-4119, 2013.

H. Wang, P. Diaz-reigosa, and F. Blaabjerg, A humidity-dependent lifetime derating factor for DC film capacitors, Proc. 2015 IEEE Energy Conversion Congress and Exposition (ECCE), pp.3064-3068

S. C. Xia, R. C. Kwong, V. I. Adamovich, M. S. Weaver, and J. J. Brown, OLED device operational lifetime: insights and challenges, Proc. 45th Annual 2007 IEEE International Reliability Physics Symposium, pp.253-257

X. Zhou, J. He, L. S. Liao, M. Lu, M. X. Ding et al.,

Q. X. Zhang, T. S. He, and . Lee, Real-time observation of temperature rise and thermal breakdown processes in organic LEDs using an IR imaging and analysis system, Advanced Materials, vol.12, issue.4, pp.265-269, 2000.

J. Kundrata and A. Bari?, Electrical and thermal analysis of an OLED module, Proc. Comsol Conference, 2012.

B. Geffroy, P. L. Roy, and C. Prat, Organic light emitting diode (OLED) technology: materials, devices and display technologies, Polymer international, vol.55, issue.6, pp.572-582, 2006.

Y. S. Tyan, Organic light-emitting-diode lighting overview, Journal of Photonics for Energy, vol.1, issue.1, pp.11009-011009, 2011.

J. I. Park and S. J. Bae, Direct prediction methods on lifetime distribution of organic light-emitting diodes from accelerated degradation tests, IEEE Transactions on Reliability, vol.59, issue.1, pp.74-90, 2010.

Y. Zhu, N. Narendran, J. Tan, and X. Mou, An imaging-based photometric and colorimetric measurement method for characterizing OLED panels for lighting applications, Proc. 2014 SPIE International Society for Optics and Photonics Thirteenth International Conference on Solid State Lighting

, Organic Light Emitting Diode (OLED) Panels, vol.8752, 2013.

, Organic light emitting diode (OLED) panels for general lighting -Safety requirements, IEC, vol.62868, 2014.

T. Tsujimura, K. Furukawa, H. Ii, H. Kashiwagi, M. Miyoshi et al., World's first all phosphorescent OLED product for lighting application, Proc. IDW 2011 Digest, p.455

K. Kwak, K. Cho, and S. Kim, Analysis of thermal degradation of organic light-emitting diodes with infrared imaging and impedance spectroscopy, Optics express, vol.21, issue.24, pp.29558-29566, 2013.

A. Cester, D. Bari, J. Framarin, N. Wrachien, G. Meneghesso et al., Thermal and electrical stress effects of electrical and optical characteristics of Alq3/NPD OLED, Microelectronics Reliability, vol.50, issue.9, pp.1866-1870, 2010.

H. Pang, L. Michalski, M. S. Weaver, R. Ma, and J. J. Brown, Thermal behavior and indirect life test of large-area OLED lighting panels, Journal of Solid State Lighting, vol.1, issue.1, pp.1-13, 2014.

J. Zhang, T. Zhou, H. Wu, Y. Liu, W. Wu et al., Constant-stepstress accelerated life test of white OLED under Weibull distribution case, IEEE Transactions on Electron Devices, vol.59, issue.3, pp.715-720, 2012.

J. Zhang, F. Liu, Y. Liu, H. Wu, W. Wu et al., A study of accelerated life test of white OLED based on maximum likelihood estimation using lognormal distribution, IEEE Transactions on Electron Devices, vol.59, pp.3401-3404, 2012.

J. Zhang, W. Li, G. Cheng, X. Chen, H. Wu et al., Life prediction of OLED for constant-stress accelerated degradation tests using luminance decaying model, J. Luminesc, vol.154, pp.491-495, 2014.

H. Kim, H. Shin, J. Park, Y. Choi, and J. Park, Statistical modeling and reliability prediction for transient luminance degradation of flexible OLEDs, IEEE International Reliability Physics Symposium (IRPS), 2018.

D. W. Kim, H. Oh, B. D. Youn, and D. Kwon, Bivariate Lifetime Model for Organic Light-Emitting Diodes, IEEE Transactions on Industrial Electronics, vol.64, issue.3, pp.2325-2334, 2017.

F. Salameh, A. Picot, M. Chabert, and P. Maussion, Parametric and nonparametric models for lifespan modeling of insulation systems in electrical machines, IEEE Transactions on Industry Applications, Special Issue on Fault Diagnosis of Electric Machines, Power Electronics and Drives, vol.53, issue.3, pp.3119-3128, 2017.
URL : https://hal.archives-ouvertes.fr/hal-01611696

M. Szczepanski, D. Malec, P. Maussion, B. Petitgas, and P. Manfé, Prediction of the lifespan of enameled wires used in low voltage inverter-fed motors by using the Design of Experiments (DoE, Proc. IEEE Industry Applications Society Annual Meeting, 2017.

A. Alchaddoud, L. Canale, G. Ibrahem, and G. Zissis, Photometric and electrical characterizations of large area OLEDs aged under thermal and electrical stresses, IEEE Transactions on Industry Applications, vol.55, 2019.
URL : https://hal.archives-ouvertes.fr/hal-02435726

R. Fisher, The design of experiments, 1935.

G. Taguchi and S. Konishi, Orthogonal arrays and linear graph, 1987.

A. I. Khuri and S. Mukhopadhyay, Response surface methodology, Wiley Interdisciplinary Reviews: Computational Statistics, vol.2, issue.2, pp.128-149, 2010.

F. Salameh, A. Picot, L. Canale, G. Zissis, and P. ,

M. Maussion and . Chabert, Parametric lifespan models for OLEDs using Design of Experiments (DoE), Industrial Application Society Annual Meeting, 2018.
URL : https://hal.archives-ouvertes.fr/hal-02319746

A. Gassmann, S. V. Yampolskii, A. Klein, K. Albe, N. Vilbrandt et al., Study of electrical fatigue by defect engineering in organic light-emitting diodes, Mater. Sci. Eng. B, vol.192, pp.26-51, 2015.