Non-destructive testing on creep degraded 12% Cr-Mo-W-V ferritic test samples using Barkhausen noise

Bhaawan Gupta (1, 2, 3) , Benjamin Ducharne (1) , Tetsuya Uchimoto (3, 2) , Gaël Sebald (3) , Takamichi Miyazaki (4) , Toshiyuki Takagi (3, 2)

1 LGEF - Laboratoire de Génie Electrique et Ferroélectricité
2 IFS - Institute of Fluid Sciences [Sendai]
3 ELyTMaX
4 Tohoku University [Sendai]

Domaines: Electromagnétisme

Bhaawan Gupta, Benjamin Ducharne, Tetsuya Uchimoto, Gaël Sebald, Takamichi Miyazaki, et al.. Non-destructive testing on creep degraded 12% Cr-Mo-W-V ferritic test samples using Barkhausen noise. Journal of Magnetism and Magnetic Materials, 2020, 498, pp.166102. ⟨10.1016/j.jmmm.2019.166102⟩. ⟨hal-02458830⟩