Investigation of undoped and Tb-doped ZnO films on Al2O3 substrate by infrared reflection method

O. Melnichuk (1) , L. Melnichuk (1) , B. Tsykaniuk , Z. Tsybrii (2) , P. Lytvyn , C. Guillaume (3) , X. Portier (3) , V. Strelchuk (2) , Ye. Venger , L. Khomenkova (2) , N. Korsunska (2)

1 MGSUN - Mykola Gogol State University of Nizhyn
2 V.E. Lashkaryov Institute of Semiconductor Physics
3 CIMAP - UMR 6252 - Centre de recherche sur les Ions, les MAtériaux et la Photonique

Domaines: Science des matériaux [cond-mat.mtrl-sci]; Matériaux; Optique / photonique; Micro et nanotechnologies/Microélectronique; Matériaux; Electromagnétisme; Optique [physics.optics]; Physique Numérique [physics.comp-ph]

O. Melnichuk, L. Melnichuk, B. Tsykaniuk, Z. Tsybrii, P. Lytvyn, et al.. Investigation of undoped and Tb-doped ZnO films on Al2O3 substrate by infrared reflection method. Thin Solid Films, 2019, 673, pp.136-140. ⟨10.1016/j.tsf.2019.01.028⟩. ⟨hal-02413218⟩