Numerical Simulations for Sensitivity Analysis of the Electrostatic Force Curve on Charge Localization in 3D
Résumé
In the present work we present a model for Atomic Force Microscopy (AFM) tip interacting electrostatically with a thin dielectric layer. Numerical simulations enabled us to estimate the electrostatic force induced by a half-ellipsoid charge distribution. The sensitivity of the shape of the Electrostatic Force Distance Curves (EFDC) to charge localization is investigated for the charge parameters as radius, depth and density of charges.
Domaines
Physique [physics]
Origine : Fichiers produits par l'(les) auteur(s)