Measurement issues of on-Silicon de- embedding test structures in the Sub-THz range

Chandan Yadav (1) , Marina Deng (1) , Sebastien Fregonese (1) , Magali de Matos (1) , Thomas Zimmer (1)

1 IMS - Laboratoire de l'intégration, du matériau au système

Domaines: Micro et nanotechnologies/Microélectronique

Chandan Yadav, Marina Deng, Sebastien Fregonese, Magali de Matos, Thomas Zimmer. Measurement issues of on-Silicon de- embedding test structures in the Sub-THz range. AKB working group, Nov 2018, Frickenhausen, Germany. ⟨hal-02380246⟩