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Machine learning applications in IC testing

Abstract : In recent years, a large number of works have surfaced demonstrating applications of machine learning in the field of integrated circuit testing. Many of these works showcase the effectiveness of machine learning compared to the current industry practice on actual case studies with industrial data. The aim of the paper is to offer a concise and comprehensive tutorial on machine learning applications in integrated circuit testing and to provide some practical recommendations for practitioners.
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https://hal.archives-ouvertes.fr/hal-02369135
Contributor : Haralampos Stratigopoulos <>
Submitted on : Monday, November 18, 2019 - 5:58:19 PM
Last modification on : Tuesday, March 23, 2021 - 9:28:02 AM

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Haralampos-G. Stratigopoulos. Machine learning applications in IC testing. 2018 IEEE European Test Symposium (ETS), May 2018, Bremen, Germany. pp.1-10, ⟨10.1109/ETS.2018.8400701⟩. ⟨hal-02369135⟩

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