Admittivity imaging from multi-frequency micro-electrical impedance tomography

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https://hal.archives-ouvertes.fr/hal-02352559
Contributor : Laure Giovangigli <>
Submitted on : Wednesday, November 6, 2019 - 9:17:06 PM
Last modification on : Thursday, November 7, 2019 - 1:43:59 AM

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Habib Ammari, Laure Giovangigli, Loc Hoang Nguyen, Jin-Keun Seo. Admittivity imaging from multi-frequency micro-electrical impedance tomography. Journal of Mathematical Analysis and Applications, Elsevier, 2017, 449 (2), pp.1601-1618. ⟨10.1016/j.jmaa.2017.01.004⟩. ⟨hal-02352559⟩

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