BIST Method for Die-Level Process Parameter Variation Monitoring in Analog/Mixed-Signal Integrated Circuits

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https://hal.archives-ouvertes.fr/hal-02352381
Contributor : Manuel Jose Barragan Asian <>
Submitted on : Wednesday, November 6, 2019 - 6:35:03 PM
Last modification on : Wednesday, November 6, 2019 - 6:35:03 PM

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Amir Zjajo, Manuel J. Barragan Asian, Jose Pineda de Gyvez. BIST Method for Die-Level Process Parameter Variation Monitoring in Analog/Mixed-Signal Integrated Circuits. Design, Automation & Test in Europe Conference, Apr 2007, Nice, France. pp.1-6, ⟨10.1109/DATE.2007.364477⟩. ⟨hal-02352381⟩

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