Multireflection grazing incidence diffraction used for stress measurementsin surface layers

Marianna Marciszko (1) , Andrzej Baczmanski (1) , Miroslaw Wrobel (1) , Wilfried Seiler (2) , Chedly Braham (2) , Jörn Donges (3) , Maciej Iek Sniechowski (1) , Krzysztof Wierzbanowskia (1)

1 AGH UST - AGH University of Science and Technology [Krakow, PL]
2 PIMM - Laboratoire Procédés et Ingénierie en Mécanique et Matériaux
3 DESY - Deutsches Elektronen-Synchrotron [Hamburg]

The geometry based on the multireflection grazing incidence X-ray diffraction can be applied to measure residual stresses. Using this method, it is possible to perform a non-destructive analysis of the heterogeneous stresses for different and well defined volumes below the surface of the sample (range of several μm). As the result, the average values of stresses weighted by absorption of X-ray radiation are measured. In this work the stress profiles as a function of penetration depth were determined for mechanically polished Al sample. Measurements and verification of the method were performed using classical X-ray diffractometer and synchrotron radiation with different wavelengths.

Mots clés: Grazing incidence geometry; X-ray diffraction; Surface layers; Residual stresses

Domaines: Mécanique des matériaux [physics.class-ph]

Marianna Marciszko, Andrzej Baczmanski, Miroslaw Wrobel, Wilfried Seiler, Chedly Braham, et al.. Multireflection grazing incidence diffraction used for stress measurementsin surface layers. Thin Solid Films, 2013, 530, pp.81-84. ⟨10.1016/j.tsf.2012.05.042⟩. ⟨hal-02350745⟩