Non-destructive analysis: PIXE with high-energy ion beam at the ARRONAX cyclotron

Q Mouchard (1) , Charbel Koumeir (2) , Noël Servagent (1) , Vincent Métivier (1)

1 SUBATECH - Laboratoire de physique subatomique et des technologies associées
2 GIP ARRONAX - Accélérateur pour la Recherche en Radiochimie et Oncologie [Nantes Atlantique]

Particle Induced X-ray Emission (PIXE) high-energy ion beam analysis allows for non-destructive multi-element analysis. This analysis allows the identification and quantification of medium and heavy elements in the samples, with a resolution of ug/g [1., 2.]. Several studies have shown the interest of coupling this method with another using gamma ray (Particle Induced Gamma Emission - PIGE) to complete the analysis for light elements [2., 3.].In order to be able to perform the PIXE analysis, it is necessary to know lots of important information: the effective ionization section, the characteristics of the different detectors, but also the intensity of the ion beam. In this study, an analysis of the measurement of the intensity of the different detectors available was performed for different ions (protons, deuterons, alpha particles) at different energies (17 to 68 MeV) for a wide range of intensity (150 fA, 40 nA). The results made it possible to define the optimal ranges of use of each detector according to the wishes of the use in terms of energies and intensities of the ions delivered by the beam. Another part of the study was devoted to determining the characteristics of a semiconductor x-ray detector (XPIPS). Various measurements were used to define the characteristics of the detector's components (thickness of the beryllium window, the vacuum, the Si semiconductor, etc.). These results determined the detector's effectiveness using different sources: Fe-55 (5.9 keV), Cd-109 (22.1 keV) and Am-241 (59.5 keV). Finally, different measurements of effective production sections were made for different targets (Ag, Au, Cu and Ti). These results could be compared with existing data and a theoretical model [3.]. 1.C. Koumeir et al, A new facility for High energy PIXE at the ARRONAX Facility, Proceeding of European Conference On x-ray spectrometry 20-25 June 2010 Figueira da Foz, Coimbra, PORTUGAL. \newline 2. M. Hazim, Measurements of K-shell ionization cross sections induced by high energy proton beams over a wide range of atomic number, thesis (2017). \newline 3. A. Subercaze, Combined used of X and gamma ray emission induced by the interaction of light charged ions with matter at medium energy: from primary reactions mechanisms to applications, thesis (2017).

Domaines: Physique Nucléaire Expérimentale [nucl-ex]

Q Mouchard, Charbel Koumeir, Noël Servagent, Vincent Métivier. Non-destructive analysis: PIXE with high-energy ion beam at the ARRONAX cyclotron. Journée de l'Ecole Doctorale 3M - Nantes (2019), Jun 2019, Nantes, France. , 2019. ⟨hal-02347130⟩