TIMED-EVENT-STATE-BASED DIAGNOSER FOR MANUFACTURING SYSTEMS

M Sayed-Mouchaweh (1) , A. Philippot (2) , V. Carre-Menetrier (2) , Bernard Riera (2)

1 IMT Lille Douai - Ecole nationale supérieure Mines-Télécom Lille Douai
2 CRESTIC - Centre de Recherche en Sciences et Technologies de l'Information et de la Communication - EA 3804

This paper proposes an adapted diagnoser for marnifactiiring systems. This diagnoser combines event and state based models to infer the fault's occurrence using event sequences and state conditions characterized by sensor's readings and commands issued by the controller. Furthermore, this diagnoser uses expectation functions to capture the inherent temporal dynamics of the system represented by time delays between correlated events.

Domaines: Automatique / Robotique

M Sayed-Mouchaweh, A. Philippot, V. Carre-Menetrier, Bernard Riera. TIMED-EVENT-STATE-BASED DIAGNOSER FOR MANUFACTURING SYSTEMS. International Conference on Information Technology for Balanced Automation Systems BASYS 2006, Sep 2006, Niagara Falls, United States. ⟨hal-02339384⟩