Circuit-Type modelling of SiC power Mosfet in short-circuit operation including selective fail-to-open and fail-to-short modes competition

Document type :
Conference papers
Complete list of metadatas

https://hal.archives-ouvertes.fr/hal-02337067
Contributor : Frédéric Richardeau <>
Submitted on : Tuesday, October 29, 2019 - 11:43:09 AM
Last modification on : Friday, December 6, 2019 - 11:30:04 AM

Identifiers

  • HAL Id : hal-02337067, version 1

Collections

Citation

Frédéric Richardeau, François Boige. Circuit-Type modelling of SiC power Mosfet in short-circuit operation including selective fail-to-open and fail-to-short modes competition. 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Sep 2019, Toulouse, France. ⟨hal-02337067⟩

Share

Metrics

Record views

6