Derivation of imperfect interface models coupling damage and temperature - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Computers & Mathematics with Applications Année : 2019

Derivation of imperfect interface models coupling damage and temperature

Résumé

In this paper we introduce a model describing a layered structure composed by two thermoelastic adherents and a thin adhesive subject to a degradation process. By an asymptotic expansion method, we derive a model of imperfect interface coupling damage and temperature evolution. Moreover, assuming that the behaviour of the adhesive is ruled by two different regimes, one in traction and one in compression, we derive a second limit model where unilateral contact conditions on the interface are also included.
Fichier principal
Vignette du fichier
bonetti2018.pdf (203.94 Ko) Télécharger le fichier
Origine : Fichiers produits par l'(les) auteur(s)
Loading...

Dates et versions

hal-02335935 , version 1 (22-11-2019)

Identifiants

Citer

Elena Bonetti, Giovanna Bonfanti, Frédéric Lebon. Derivation of imperfect interface models coupling damage and temperature. Computers & Mathematics with Applications, 2019, 77 (11), pp.2906-2916. ⟨10.1016/j.camwa.2018.09.027⟩. ⟨hal-02335935⟩
28 Consultations
57 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More