The [10-10] edge dislocation in the wurtzite structure: A high-resolution transmission electron microscopy investigation of [0001] tilt grain boundaries in GaN and ZnO

Siqian Li (1) , Jun Chen (1) , Pierre Ruterana (1)

1 CIMAP - UMR 6252 - Centre de recherche sur les Ions, les MAtériaux et la Photonique

Domaines: Matériaux; Cristallographie; Physique [physics]

Siqian Li, Jun Chen, Pierre Ruterana. The [10-10] edge dislocation in the wurtzite structure: A high-resolution transmission electron microscopy investigation of [0001] tilt grain boundaries in GaN and ZnO. Acta Materialia, 2019, 175, pp.457-465. ⟨10.1016/j.actamat.2019.06.044⟩. ⟨hal-02335340⟩