Decorrelation-induced speckle phase noise in two-wavelength digital holographic profilometry

Matthieu Piniard (1) , Pascal Picart (2, 3) , Béatrice Sorrente (1) , Gilles Hug (4)

1 DOTA, ONERA, Université Paris Saclay (COmUE) [Châtillon]
2 LAUM - Laboratoire d'Acoustique de l'Université du Mans
3 ENSIM - Ecole Nationale Supérieure d'Ingénieurs du Mans
4 LEM - ONERA - CNRS - Laboratoire d'étude des microstructures [Châtillon]

This paper proposes a realistic wavelength decorrelation induced speckle noise simulator. The investigation of the dependence of the coherence factor versus the surface shape, the surface roughness and the wavelength change is carried out.

Mots clés: DIGITAL HOLOGRAPHY; HOLOGRAPHIC INTERFEROMETRY; IMAGE RECONSTRUCTION TECHNIQUES; SCATTERING; ROUGH SURFACES

Mots clés: HOLOGRAPHIE NUMERIQUE; SPECKLE; DEUX LONGUEURS D'ONDE; PROFILOMETRIE

Domaines: Sciences de l'ingénieur [physics]; Physique [physics]

Matthieu Piniard, Pascal Picart, Béatrice Sorrente, Gilles Hug. Decorrelation-induced speckle phase noise in two-wavelength digital holographic profilometry. Digital Holography and 3D Imaging, May 2019, BORDEAUX, France. ⟨hal-02329521⟩