Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT) - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Materials Année : 2018

Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT)

Résumé

Multilayer ceramic capacitors (MLCC) are essential components for determining the reliability of electronic components in terms of time to failure. It is known that the reliability of MLCCs depends on their composition, processing, and operating conditions. In this present work, we analyzed the lifetime of three similar X7R type MLCCs based on BaTiO3 by conducting High Accelerated Life Tests (HALT) at temperatures up to 200 °C at 400 V and 600 V. The results were adjusted to an Arrhenius equation, which is a function of the activation energy (Ea) and a voltage stress exponent (n), in order to predict their time to failure. The values of Ea are in the range of 1–1.45 eV, which has been reported for the thermal failure and dielectric wear out of BaTiO3-based dielectric capacitors. The stress voltage exponent value was in the range of 4–5. Although the Ea can be associated with a failure mechanism, n only gives an indication of the effect of voltage in the tests. It was possible to associate those values with each type of tested MLCC so that their expected life could be estimated in the range of 400–600 V
Fichier principal
Vignette du fichier
Hernandez-Lopez_24531.pdf (5.82 Mo) Télécharger le fichier
Origine : Fichiers éditeurs autorisés sur une archive ouverte
Loading...

Dates et versions

hal-02327989 , version 1 (23-10-2019)

Identifiants

Citer

Ana Maria Hernández-López, Juan Aguilar-Garib, Sophie Guillemet, Roman Nava-Quintero, Pascal Dufour, et al.. Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT). Materials, 2018, 11 (10), pp.1900. ⟨10.3390/ma11101900⟩. ⟨hal-02327989⟩
156 Consultations
61 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More