Skip to Main content Skip to Navigation
Conference papers

Analysis and Assessment of temperature effect of an Open LoopActive Gate Voltage Control in GaN Transistor During Turn-ON and Turn-OFF

Document type :
Conference papers
Complete list of metadata

https://hal.archives-ouvertes.fr/hal-02310021
Contributor : Umi3463 Ln2 <>
Submitted on : Wednesday, October 9, 2019 - 5:51:31 PM
Last modification on : Monday, September 13, 2021 - 2:44:04 PM

Identifiers

  • HAL Id : hal-02310021, version 1

Citation

Mamadou Lamine Beye, Jean-Fraçois Mogniotte, Luong-Viet Phung, Nadir Idir, Hassan Maher, et al.. Analysis and Assessment of temperature effect of an Open LoopActive Gate Voltage Control in GaN Transistor During Turn-ON and Turn-OFF. 13th IEEE PEDS, Jul 2019, Toulouse, France. ⟨hal-02310021⟩

Share

Metrics

Record views

163