Finite element based surface roughness study for ohmic contact of microswitches

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https://hal.archives-ouvertes.fr/hal-02186310
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Submitted on : Wednesday, July 17, 2019 - 11:46:36 AM
Last modification on : Tuesday, October 22, 2019 - 5:20:43 PM

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H. Liu, Dimitri Leray, Stéphane Colin, P. Pons, A. Broué. Finite element based surface roughness study for ohmic contact of microswitches. 58th IEEE Holm Conference on Electrical Contacts, Portland, Oregon, USA, 2012, Portland, Oregon, United States. pp.6336607:1-10, ⟨10.1109/HOLM.2012.6336607⟩. ⟨hal-02186310⟩

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