Measurement of stress in phosphated-iron oxide layers by in-situ diffraction of synchrotron radiation
Résumé
In the present work the development of residual strains in the iron-oxide layers growing on α-Fe and phosphated α-Fe at 400°C in artificial air at 1 atm was investigated by X-ray diffraction of synchrotron radiation, both in-situ during oxide growth and at room temperature after cooling. The oxidation kinetics of α-Fe and phosphated α-Fe at 400°C and the microstructural state of the oxide layers are first presented. Then a detailed study of the residual strains in the oxides layers is undertaken. Correlations between the residual stresses measurements and the successive parabolic oxidation stages for phosphated α-iron are established. It leads to a better understanding of the oxidation behaviour.