Electrical double-layer capacitors: evaluation of ageing phenomena during cycle life testing

Noshin Omar (1) , Hamid Gualous (2) , Justin Salminen , Grietus Mulder , Ahmadou Samba (2) , Yousef Firouz , Mohamed Abdel Monem , Peter van den Bossche , Joeri van Mierlo (1)

1 VUB - Vrije Universiteit Brussel
2 LUSAC - Laboratoire Universitaire des Sciences Appliquées de Cherbourg

This paper represents an assessment of the main ageing phenomena in electrical double-layer capacitors (EDLCs). In this study the cycle life of the EDLC cells with a rated capacitance of 1,600 F has been investigated at different ambient temperatures and current rates. From the experimental results we can observe that the impact of the high ambient temperature is significant on the cycle life of the cells. Moreover, the results also show the negative impact of the current rate. The internal resistance tests showed that the increase of the resistance is much higher than the decrease of the capacitance. Thus, the ageing of the EDLC during cycling was clearly non-linear. Further the EIS measurements indicated the higher increase of the imaginary part of the impedance at low frequencies during cycling, which indicates the capacitance fade.

Mots clés: Electrical double-layer capacitors; Ageing; Internal resistance increase; Capacitance fade; EIS; Lifetime model

Domaines: Sciences de l'ingénieur [physics]; Sciences de l'environnement; Physique [physics]; Matériaux; Milieux fluides et réactifs

Noshin Omar, Hamid Gualous, Justin Salminen, Grietus Mulder, Ahmadou Samba, et al.. Electrical double-layer capacitors: evaluation of ageing phenomena during cycle life testing. Journal of Applied Electrochemistry, 2014, 44 (4), pp.509-522. ⟨10.1007/s10800-013-0640-4⟩. ⟨hal-02150672⟩