Characterization of Different Technologies of GaN HEMTs of 0,15 µm Ultra-Short Gate Length: Identification of Traps Using TCAD Based 2D Physics-based Simulation - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2019

Characterization of Different Technologies of GaN HEMTs of 0,15 µm Ultra-Short Gate Length: Identification of Traps Using TCAD Based 2D Physics-based Simulation

Mohamed Bouslama
Raphaël Sommet

Domaines

Electronique
Fichier non déposé

Dates et versions

hal-02141233 , version 1 (27-05-2019)

Identifiants

  • HAL Id : hal-02141233 , version 1

Citer

Mohamed Bouslama, Raphaël Sommet, Jean-Christophe Nallatamby. Characterization of Different Technologies of GaN HEMTs of 0,15 µm Ultra-Short Gate Length: Identification of Traps Using TCAD Based 2D Physics-based Simulation. 2019 14th European Microwave Microwave Conference, Oct 2019, PARIS, France. ⟨hal-02141233⟩
16 Consultations
0 Téléchargements

Partager

Gmail Facebook X LinkedIn More