Impact of Complex-Logic Cell Layout on the Single-Event Transient Sensitivity

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https://hal.archives-ouvertes.fr/hal-02136500
Contributor : Frédéric Wrobel <>
Submitted on : Wednesday, May 22, 2019 - 10:39:55 AM
Last modification on : Thursday, July 25, 2019 - 4:20:08 PM

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Y. Aguiar, Frédéric Wrobel, J-L. Autran, P. Leroux, Frédéric Saigné, et al.. Impact of Complex-Logic Cell Layout on the Single-Event Transient Sensitivity. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2019, pp.1-1. ⟨10.1109/TNS.2019.2918077⟩. ⟨hal-02136500⟩

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