Radiation Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Application

Alexandre Le Roch (1) , Vincent Goiffon (1) , Clémentine Durnez (1) , Pierre Magnan (1) , Cédric Virmontois (2) , L. Pistre (2) , Jean-Marc Belloir (2)

1 DEOS - Département Electronique, Optronique et Signal
2 CNES - Centre National d'Études Spatiales [Toulouse]

We propose to identify the displacement damage defects induced by proton and carbon irradiations in a commercial off-the-shelf pinned photodiode (PPD) 8T-CMOS image sensors (CISs) dedicated to space application operating in global shutter mode. This paper aims to provide a better understanding of defects creation in a specific space image sensor. Therefore, it leads to comparable results to those we could find during the mission. The study focuses on bulk defects located in the PPD depleted region which represents the main dark current contribution in PPD CIS. Four sensors have been irradiated with carbon ions and protons at different energies and fluencies. Using both the dark current spectroscopy and the random telegraph signal (RTS) analysis, we investigate defects behavior for different isochronal annealing temperatures. By combining these results, we make the connection between two complementary phenomena and bring out the prevalence of divacancies-based defects in term of dark current contribution.

Mots clés: CMOS Image Sensor; Dark Current Spectroscopie; Random Telegraph Signal; Pinned Photodiode; Space Radiation

Domaines: Traitement du signal et de l'image [eess.SP]

Alexandre Le Roch, Vincent Goiffon, Clémentine Durnez, Pierre Magnan, Cédric Virmontois, et al.. Radiation Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Application. 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2017), Oct 2017, Genève, Switzerland. ⟨hal-02115909⟩