SEL/SEU/SEFI/TID Results of the Radiation Hardened DDR3 SDRAM Memory Solution

Pierre-Xiao Wang (1) , Pierre Kohler (1) , Martin Herrmann , Torsten Fichna , Vincent Pouget (2, 3) , Frédéric Saigné (2, 3)

1 3D Plus
2 IES - Institut d’Electronique et des Systèmes
3 RADIAC - Radiations et composants

Domaines: Micro et nanotechnologies/Microélectronique; Electronique

Pierre-Xiao Wang, Pierre Kohler, Martin Herrmann, Torsten Fichna, Vincent Pouget, et al.. SEL/SEU/SEFI/TID Results of the Radiation Hardened DDR3 SDRAM Memory Solution. 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018), Jul 2018, Waikoloa Village, France. pp.1-5, ⟨10.1109/NSREC.2018.8584290⟩. ⟨hal-02088739⟩