Aging and Gate Bias Effects on TID Sensitivity of Wide Bandgap Power Devices

Kimmo Niskanen (1, 2) , Antoine Touboul (1, 2) , Rosine Coq Germanicus , Frédéric Wrobel (2, 1) , F. Saigné (1, 2) , Jérôme Boch (1, 2) , Alain Michez (1, 2) , Vincent Pouget (1, 2)

1 IES - Institut d’Electronique et des Systèmes
2 RADIAC - Radiations et composants

Domaines: Electronique

Kimmo Niskanen, Antoine Touboul, Rosine Coq Germanicus, Frédéric Wrobel, F. Saigné, et al.. Aging and Gate Bias Effects on TID Sensitivity of Wide Bandgap Power Devices. IEEE RADECS2018, Sep 2018, Goteborg, Sweden. ⟨hal-02086450⟩