Analysis of the charge sharing effect in the SET sensitivity of bulk 45nm standard cell layouts under heavy ions

Ygor Quadros de Aguiar (1, 2) , Frédéric Wrobel (1, 2) , Jean-Luc Autran (3) , Paul Leroux , Frédéric Saigné (2, 1) , Antoine Touboul (2, 1) , Vincent Pouget (2, 1)

1 RADIAC - Radiations et composants
2 IES - Institut d’Electronique et des Systèmes
3 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

Domaines: Electronique

Ygor Quadros de Aguiar, Frédéric Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, et al.. Analysis of the charge sharing effect in the SET sensitivity of bulk 45nm standard cell layouts under heavy ions. 29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2018), Oct 2018, Aalborg, Denmark. ⟨hal-02086379⟩