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Communication Dans Un Congrès Année : 2016

Integration and Electrical Characterization of Indium-Oxide Nanoparticles in Oxide Resistive Random-Access Memories

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hal-02079236 , version 1 (25-03-2019)

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  • HAL Id : hal-02079236 , version 1

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A. Souifi, E. Cossec, K. Hamga, P.-V. Guenery, M. Troudi, et al.. Integration and Electrical Characterization of Indium-Oxide Nanoparticles in Oxide Resistive Random-Access Memories. CMOS Emerging Technologies, May 2016, Montreal, Canada. ⟨hal-02079236⟩
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