Characterization of carrier concentration in ZnO nanowires by scanning capacitance microscopy

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https://hal.archives-ouvertes.fr/hal-02073118
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Submitted on : Tuesday, March 19, 2019 - 4:10:39 PM
Last modification on : Friday, January 10, 2020 - 3:42:18 PM

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Lin Wang, Sophie Guillemin, Jean-Michel Chauveau, Vincent Sallet, François Jomard, et al.. Characterization of carrier concentration in ZnO nanowires by scanning capacitance microscopy. physica status solidi (c), Wiley, 2016, 13 (7-9), pp.576-580. ⟨10.1002/pssc.201510268⟩. ⟨hal-02073118⟩

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