Scanning tunneling microscopy study of the epitaxial growth of strained In0.82Ga0.18As layers on InP - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces Année : 1996

Scanning tunneling microscopy study of the epitaxial growth of strained In0.82Ga0.18As layers on InP

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hal-02071368 , version 1 (18-03-2019)

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  • HAL Id : hal-02071368 , version 1

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Louis Porte, Pascal Krapf, Yves Robach, Magali Phaner-Goutorbe, Michel Gendry, et al.. Scanning tunneling microscopy study of the epitaxial growth of strained In0.82Ga0.18As layers on InP. Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces, 1996, 352-354, pp.60-65. ⟨hal-02071368⟩
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