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6H-SiC-Fe Nanostructures Studied by Atom Probe Tomography

Lindor Diallo 1 Abdeslem Fnidiki 1 Luc Lechevallier 1 Amjaad Zarefy 1 Jean Juraszek 1 Fabien Cuvilly 1 Ivan Blum 1 Michel Viret 2 Marc Marteau 3 Dominique Eyidi 3 Alain Declemy 4
2 LNO - Laboratoire Nano-Magnétisme et Oxydes
SPEC - UMR3680 - Service de physique de l'état condensé, IRAMIS - Institut Rayonnement Matière de Saclay
4 PDP - Physique des Défauts et de la Plasticité PDP
Département Physique et Mécanique des Matériaux - Département Physique et Mécanique des Matériaux
Abstract : Low-dose (2 at.%) Fe implantation in 6H-SiC (0001), followed by high-temperature annealing, is investigated with the aim of obtaining a diluted magnetic semiconductor (DMS). The effects of rapid thermal annealing on the microstructure were examined by atom probe tomography. The study shows the evidence of the formation of nanoclusters after annealing, some of which are magnetic. The structural study is correlated with the magnetic properties in order to determine the optimum conditions for fabricating a DMS.
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Submitted on : Friday, March 8, 2019 - 12:43:40 PM
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Lindor Diallo, Abdeslem Fnidiki, Luc Lechevallier, Amjaad Zarefy, Jean Juraszek, et al.. 6H-SiC-Fe Nanostructures Studied by Atom Probe Tomography. IEEE Magnetics Letters, IEEE, 2018, 9, pp.1-3. ⟨10.1109/lmag.2018.2829109⟩. ⟨hal-02061774⟩



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