H. Happy, K. Haddadi, D. Théron, T. Lasri, and G. Dambrine, Measurement techniques for RF nanoelectronic devices : new equipment to overcome the problems of impedance and scale mismatch, IEEE Microwave Magazine, vol.15, issue.1, pp.30-39, 2014.
URL : https://hal.archives-ouvertes.fr/hal-00936563

Z. Yu and P. J. Burke, Microwave transport in single-walled carbon nanotubes, Nano Letters, vol.5, issue.7, pp.1403-1406, 2005.

T. Wallis, A. Imtiaz, H. Nembach, K. A. Bertness, N. A. Sanford et al., Calibrated broadband electrical characterization of nanowires, Conference on Precision Electromagnetic Measurements Digest, pp.684-685, 2008.

U. Arz, S. Zinal, T. Probst, G. Hechtfischer, F. J. Schmückle et al., Establishing traceability for on-wafer S-parameter measurements of membrane technology devices up to 110 GHz, 2017 90th ARFTG Microwave Measurement Symposium (ARFTG), pp.1-4, 2017.

L. Galatro and M. Spirito, Millimeter-Wave On-Wafer TRL Calibration Employing 3-D EM Simulation-Based Characteristic Impedance Extraction, IEEE Transactions on Microwave Theory and Techniques, vol.65, issue.4, pp.1315-1323, 2017.

K. Daffé, G. Dambrine, F. Kleist-retzow, and K. Haddadi, RF wafer probing with improved contact repeatability using nanometer positioning, 2016 87th ARFTG Microwave Measurement Conference (ARFTG), pp.1-4, 2016.

D. K. Rytting, Network analyzer accuracy overview, 58 th ARFTG Conference Digest, vol.40, pp.1-13, 2001.