Dispersion study of DC and Low Frequency Noise in SiGe:C Heterojunction Bipolar Transistors used for mm-Wave to Terahertz applications

Marcelino Seif (1, 2) , F. Pascal (1, 2) , Bruno Sagnes (1, 2) , Alain Hoffmann (1, 2) , S. Haendler (3) , Pascal Chevalier (3) , Daniel Gloria (4)

1 IES - Institut d’Electronique et des Systèmes
2 M@CSEE - Micro électronique, Composants, Systèmes, Efficacité Energétique
3 ST-CROLLES - STMicroelectronics [Crolles]
4 STMicroelectronics

Domaines: Sciences de l'ingénieur [physics]; Micro et nanotechnologies/Microélectronique

Marcelino Seif, F. Pascal, Bruno Sagnes, Alain Hoffmann, S. Haendler, et al.. Dispersion study of DC and Low Frequency Noise in SiGe:C Heterojunction Bipolar Transistors used for mm-Wave to Terahertz applications. 25th EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS - ESREF 2014, Sep 2014, Berlin, Germany. ⟨hal-02053281⟩