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Scanning Thermal Microscopy: state of the art, main challenges and application to the characterization of TE materials

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https://hal.archives-ouvertes.fr/hal-02024099
Contributor : Séverine Gomes Connect in order to contact the contributor
Submitted on : Monday, February 18, 2019 - 9:20:42 PM
Last modification on : Friday, November 20, 2020 - 3:26:11 PM

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  • HAL Id : hal-02024099, version 1

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Séverine Gomès. Scanning Thermal Microscopy: state of the art, main challenges and application to the characterization of TE materials. 2018. ⟨hal-02024099⟩

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