Thickness determination in anisotropic media with plasmon waveguide resonance imaging

Abstract : This paper describes a simple procedure to determine the local thickness of a thin anisotropic layer. It also discriminates between isotropic and anisotropic regions, provided a smoothness hypothesis on the refractive index distribution is satisfied. The procedure is based on the analysis of surface plasmon resonance (SPR) data acquired in an imaging mode. The general arrangement of the setup is the Kretschmann configuration. We show, on an azobenzene modified polymer layer, good agreement between atomic force microscopy and optical measurements of thickness variation.
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Optics Express, Optical Society of America, 2019, 27 (3), pp.3264-3275. 〈10.1364/OE.27.003264〉
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Contributeur : Étienne Harté <>
Soumis le : jeudi 7 février 2019 - 10:25:16
Dernière modification le : jeudi 14 mars 2019 - 10:09:16

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Etienne Harté, Isabel Alves, Ivo Ihrke, Juan Elezgaray. Thickness determination in anisotropic media with plasmon waveguide resonance imaging. Optics Express, Optical Society of America, 2019, 27 (3), pp.3264-3275. 〈10.1364/OE.27.003264〉. 〈hal-02010368〉

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