Space Charge Analysis of Multi-Structure Polyimide Films using TSM

S. Akram , J. Castellon (1, 2) , S. Agnel (1, 2) , M. Z. Kahn

1 IES - Institut d’Electronique et des Systèmes
2 GEM - Groupe énergie et matériaux

Domaines: Electronique

S. Akram, J. Castellon, S. Agnel, M. Z. Kahn. Space Charge Analysis of Multi-Structure Polyimide Films using TSM. IEEE Annual Conf. on Electrical Insulation and Dielectric Phenomena CEIDP 2018, 2018, Cancun, Mexico. pp. 34-37. ⟨hal-02007894⟩