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Impact of on-Silicon De-Embedding Test Structures and RF Probes Design in the Sub-THz Range

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https://hal.archives-ouvertes.fr/hal-01985501
Contributor : Marina Deng Connect in order to contact the contributor
Submitted on : Friday, January 18, 2019 - 9:46:33 AM
Last modification on : Monday, October 12, 2020 - 3:16:09 PM

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  • HAL Id : hal-01985501, version 1

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Chandan Yadav, Marina Deng, Sebastien Fregonese, Magali de Matos, Bernard Plano, et al.. Impact of on-Silicon De-Embedding Test Structures and RF Probes Design in the Sub-THz Range. 2018 48th European Microwave Conference (EuMC), Sep 2018, Madrid, Spain. ⟨hal-01985501⟩

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