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Real-cases of electromagnetic immunity and reliability in embedded electronics architectures

Abstract : This papers concerns works about electromagnetic immunity and reliability investigations on electronics devices, combined with different physical impacts as temperature.
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https://hal.archives-ouvertes.fr/hal-01977489
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Submitted on : Thursday, January 10, 2019 - 5:45:57 PM
Last modification on : Thursday, February 7, 2019 - 3:32:30 PM
Long-term archiving on: : Thursday, April 11, 2019 - 6:42:17 PM

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  • HAL Id : hal-01977489, version 1
  • OATAO : 8345

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Jean-Marc Diénot, Emmanuel Batista. Real-cases of electromagnetic immunity and reliability in embedded electronics architectures. EUROEM 2012, Jul 2012, Toulouse, France. pp.87. ⟨hal-01977489⟩

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