Test and Reliability in Approximate Computing

Lorena Anghel (1) , Mounir Benabdenbi (1) , Alberto Bosio (2) , Marcello Traiola (2) , Elena Ioana Vatajelu (1)

1 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés
2 TEST - Test and dEpendability of microelectronic integrated SysTems

This paper presents an overview of test and reliability approaches for approximate computing architectures. We focus on how specific methods for test and reliability can be used to improve the characteristics of approximate computing in terms of power consumption, area, life expectancy and precision. This paper does not address specification and design of approximate hardware/software/algorithms, but provides an in-depth knowledge on how the reliability and test related techniques can be efficiently used to maximize the benefits of approximate computing.

Mots clés: Approximate computing; Reliability; Test

Domaines: Micro et nanotechnologies/Microélectronique

Lorena Anghel, Mounir Benabdenbi, Alberto Bosio, Marcello Traiola, Elena Ioana Vatajelu. Test and Reliability in Approximate Computing. Journal of Electronic Testing: : Theory and Applications, 2018, 34 (4), pp.375-387. ⟨10.1007/s10836-018-5734-9⟩. ⟨hal-01961787⟩