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Article Dans Une Revue Journal of Applied Crystallography Année : 2016

Determination of the cationic distribution in oxidic thin films by resonant X-ray diffraction: the magnetoelectric compound Ga 2− x Fe x O 3

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hal-01957899 , version 1 (17-12-2018)

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Christophe Lefevre, Alexandre Thomasson, François Roulland, Vincent Favre-Nicolin, Yves Joly, et al.. Determination of the cationic distribution in oxidic thin films by resonant X-ray diffraction: the magnetoelectric compound Ga 2− x Fe x O 3. Journal of Applied Crystallography, 2016, 49 (4), pp.1308-1314. ⟨10.1107/S1600576716010001⟩. ⟨hal-01957899⟩
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