SEFI Modeling in Readout Integrated Circuit induced by Heavy Ions at Cryogenic Temperatures

Laurent Artola (1) , S. Ducret (2) , F. Advent (2) , Guillaume Hubert (1) , Julien Mekki (3)

1 DPHY, ONERA, Université de Toulouse [Toulouse]
2 SOFRADIR (Veurey-Voroize)
3 CNES - Centre National d'Études Spatiales [Toulouse]

This paper presents for the first time a modeling approach of SEFI which takes into account all the physical and electrical processes from the radiation particle down to the event at the system level. This work was focused on the evaluation of SEFI sensitivity by experimental and simulation analyses of a ROIC designed by Sofradir for their IR image sensors. Relevant correlations between simulation and experimental results of SEFI cross sections for heavy ions were presented and discussed. The simulation results confirmed the strong SEFI robustness of the ROIC at 57 K.

Mots clés: SINGLE EVENT FUNCTIONAL INTERRUPT; MODELING; HEAVY IONS; READOUT INTEGRATED CIRCUIT; INFRARED DETECTORS; LOW TEMPERATURES

Mots clés: MODELISATION; IONS LOURDS; CIRCUIT INTEGRE; DETECTEURS INFRAROUGES; BASSES TEMPERATURES

Domaines: Physique Atomique [physics.atom-ph]; Physique des plasmas [physics.plasm-ph]; Physique de l'espace [physics.space-ph]

Laurent Artola, S. Ducret, F. Advent, Guillaume Hubert, Julien Mekki. SEFI Modeling in Readout Integrated Circuit induced by Heavy Ions at Cryogenic Temperatures. IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018), Jul 2018, Waikoloa, HI, United States. ⟨hal-01957110⟩