Basics of Field Ion Microscopy

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Contributor : Etienne Talbot <>
Submitted on : Thursday, December 13, 2018 - 3:19:56 PM
Last modification on : Friday, July 5, 2019 - 5:24:08 PM

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F. Danoix, F. Vurpillot. Basics of Field Ion Microscopy. Atom Probe Tomography, Elsevier, pp.73-95, 2016, 978-0-12-804647-0. ⟨10.1016/B978-0-12-804647-0.00003-6⟩. ⟨hal-01954245⟩

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