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Article Dans Une Revue IOP Conference Series: Materials Science and Engineering Année : 2016

RF Pulse Signal Integrity Analysis for Nonlinear Ended Microstrip Line Atom-Probe Tomography

Antoine Normand
Fabien Delaroche
O. Latry
François Vurpillot

Résumé

A signal integrity (SI) analysis of high voltage rectangular short pulses for the atom- probe system is explored in this paper. The operated RF transient pulse is considered for exciting on material sample inside an ultra-high vacuum (UHV) cryogenic chamber. The ns- duration pulse signal is injected into the cryogenic analysis chamber through the transmitting system mainly constituted by a microstrip interconnect line ended by optical controlled nonlinear load. The whole system frequency characterization is performed based on the S- parameter measurements. As expected, a challenging ultra-short rectangular shape pulse is exhibited by the pulser. Promising experimental results with the improvement of ion mass spectrum is demonstrated with the designed RF pulser.

Dates et versions

hal-01954239 , version 1 (13-12-2018)

Identifiants

Citer

Lu Zhao, A. Delamare, Antoine Normand, Fabien Delaroche, O. Latry, et al.. RF Pulse Signal Integrity Analysis for Nonlinear Ended Microstrip Line Atom-Probe Tomography. IOP Conference Series: Materials Science and Engineering, 2016, 120, pp.012006. ⟨10.1088/1757-899X/120/1/012006⟩. ⟨hal-01954239⟩
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