A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction

Marianna Marciszko (1) , Andrzej Baczmanski (1) , Manuela Klaus (2) , Christoph Genzel (2) , Adrian Oponowicz (1) , Sebastian Wronski (1) , Mirosław Wrobel (1) , Chedly Braham (3) , Habib Sidhom (4) , Roman Wawszczak (1)

1 AGH UST - AGH University of Science and Technology [Krakow, PL]
2 HZB - Helmholtz-Zentrum Berlin für Materialien und Energie GmbH = Helmholtz Centre Berlin for Materials and Energy = Centre Helmholtz de Berlin pour les matériaux et l'énergie
3 PIMM - Laboratoire Procédés et Ingénierie en Mécanique et Matériaux
4 ESSTT - Ecole Supérieure des Sciences et Techniques [Tunis]

The main focus of the presented work was the investigation of structure and residual stress gradients in the near-surface region of materials studied by X-ray diffraction. The multireflection method was used to measure depth-dependent stress variation in near-surface layers of a Ti sample (grade 2) subjected to different mechanical treatments. First, the multireflection grazing incidence diffraction method was applied on a classical diffractometer with Cu K radiation. The applicability of the method was then extended by using a white synchrotron beam during an energy dispersive (ED) diffraction experiment. An advantage of this method was the possibility of using not only more than one reflection but also different wavelengths of radiation. This approach was successfully applied to analysis of data obtained in the ED experiment. There was good agreement between the measurements performed using synchrotron radiation and those with Cu K radiation on the classical diffractometer. A great advantage of high-energy synchrotron radiation was the possibility to measure stresses as well as the a 0 parameter and c 0 /a 0 ratio for much larger depths in comparison with laboratory X-rays.

Mots clés: MMXD; energy dispersive diffraction; hexagonal structures; synchrotron radiation; residual stress; multireflection grazing incidence diffraction; multireflection and multiwavelength X-ray diffraction; MGIXD

Domaines: Sciences de l'ingénieur [physics]

Marianna Marciszko, Andrzej Baczmanski, Manuela Klaus, Christoph Genzel, Adrian Oponowicz, et al.. A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction. Journal of Applied Crystallography, 2018, 51, pp.732-745. ⟨10.1107/S1600576718004193⟩. ⟨hal-01942796⟩