White light scattering and related techniques in far field roughness characterization

Claude Amra 1 Myriam Zerrad 1 Michel Lequime 1
1 CONCEPT - CONCEPT
FRESNEL - Institut FRESNEL
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https://hal.archives-ouvertes.fr/hal-01933116
Contributor : Myriam Zerrad <>
Submitted on : Friday, November 23, 2018 - 3:17:53 PM
Last modification on : Monday, March 4, 2019 - 2:04:24 PM

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Claude Amra, Myriam Zerrad, Michel Lequime. White light scattering and related techniques in far field roughness characterization. Optical Fabrication, Testing, and Metrology VI, SPIE Optical System Design, May 2018, Frankfurt, Germany. ⟨hal-01933116⟩

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