Analysis of thermal annealing approach to extend electronic device lifetime

S. Dhombres (1) , A. Michez (1) , J. Boch (1, 2) , S. Beauvivre (3) , D. Kraehenbuehl (3) , F. Saigné (1, 2) , J.-R. Vaillé (1, 2) , P. Adell (4) , F. Bezerra , E. Lorfèvre (5)

1 IES - Institut d’Electronique et des Systèmes
2 RADIAC - Radiations et composants
3 Systheia
4 JPL - Jet Propulsion Laboratory
5 CNES - Centre National d'Études Spatiales [Toulouse]

Domaines: Electronique

S. Dhombres, A. Michez, J. Boch, S. Beauvivre, D. Kraehenbuehl, et al.. Analysis of thermal annealing approach to extend electronic device lifetime. IEEE RADECS 2015, 2015, Moscou, Russia. ⟨hal-01932427⟩