Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis

V. Pouget (1, 2) , S. Jonathas (3) , R. Job (1) , J.-R. Vaillé (1, 2) , Frédéric Wrobel (1, 2) , F. Saigné (1, 2)

1 IES - Institut d’Electronique et des Systèmes
2 RADIAC - Radiations et composants
3 PULSCAN

Domaines: Electronique

V. Pouget, S. Jonathas, R. Job, J.-R. Vaillé, Frédéric Wrobel, et al.. Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis. European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF) 2017, 2017, Bordeaux, France. ⟨hal-01929245⟩